The observation and elemental analysis of surfaces and materials is available at different scales within the MOSAIC platform:
- study of material surface topography by Atomic Force Microscopy (AFM)
- observation of the surface of a sample by Scanning Electron Microscopy (SEM) and its elemental analysis by Energy Dispersion X-ray spectroscopy
- study of the microstructure (defects, bubbles/cavities, precipitates) and elemental analysis at the nanometric scale by Transmission Electron Microscopy (TEM)
- atomic and molecular imaging by in situ TOF SIMS mass spectrometry using Andromede accelerator